MAP13022_SENSORCATALOG


>> P.9

SemiconductorIndustryMeasurementsolutionsforawiderangeoffieldsinthesemiconductormanufacturingindustry,whichisgrowingrapidlyfollowingashifttoproductionofelectricvehicles,expansionofservicesinlinewiththeimplementationof5G,etc.semiconducIninspectionandtorsmanufactablemeasurementingprocesviatur,sessensors.weprovideprecisionWafermanufacturePatternformationtoElementformationFlatteningCMP(ChemicalMechanicalPolishing)DicingMarkingtoLeadformingDiamondbladeIgotWaferPhotomaskWaferPhotosensitizerTransistorWaferWaferPolishingplate0000■ExternaldiameterofingotLaserScanMicrometer■LithographyequipmentHigh-accuracyLinearScale■WaferthicknessHigh-accuracyLinearGageLGH,High-accuracy/resolutionMeasuringMachineLitematicVL-50■ChipthicknessLGH■Leadwidth,Pitch,GapLaserScanMicrometer6


<< | < | > | >>